Single-Wall Carbon Nanotube Conducting Probe Tips
作者： Neil R. Wilson , David H. Cobden , Julie V. Macpherson
DOI: 10.1021/JP026583B
关键词:
摘要: We describe a method for producing and characterizing electrically connected single-wall carbon nanotube scanned-probe tips. The stable contact resistance, of the order 100 kΩ, makes these tips suitable conducting probe applications. nanotubes, grown by chemical vapor deposition, are mounted on end metal-coated (gold platinum) silicon tips, using “pick-up” method. Electrical characterization is carried out lowering tube into liquid mercury measuring current through as function applied bias voltage immersion depth. This allows assessment magnitude stability well identification metallic semiconducting tubes. It also offers new geometry investigating transport properties continuous its length.
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