作者: David P. Burt , Neil R. Wilson , John M. R. Weaver , Phillip S. Dobson , Julie V. Macpherson
DOI: 10.1021/NL050018D
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摘要: We describe a method for the production of nanoelectrodes at apex atomic force microscopy (AFM) probes. The are formed from single-walled carbon nanotube AFM tips which act as template formation nanowire through sputter coating with metal. Subsequent deposition conformal insulating coating, and cutting probe end, yields disk-shaped nanoelectrode tip whose diameter is defined by amount metal deposited. demonstrate that these probes capable high-resolution combined electrochemical topographical imaging. flexibility this approach will allow fabrication controllable size composition, enabling study activity nanoscale.