Nanoscale-resolved elasticity: contact mechanics for quantitative contact resonance atomic force microscopy.
作者： A. M. Jakob , J. Buchwald , B. Rauschenbach , S. G. Mayr
DOI: 10.1039/C4NR01034E
关键词:
摘要: Contact resonance atomic force microscopy (CR-AFM) constitutes a powerful approach for nanometer-resolved mechanical characterization of surfaces. Yet, absolute accuracy is frequently impaired by ad hoc assumptions on the dynamic AFM cantilever characteristics as well contact model. Within present study, we clarify detailed interplay stress fields and geometries full quantitative understanding, employing combined experimental numerical studies real probes. Concerning description, two-parameter ansatz utilized that takes tip their corresponding indentation moduli into account. Parameter sets obtained upon data fitting different blunting states, are discussed in terms model-specific artificiality versus physics at nanoscale. Unveiling underlying detail, these findings pave way accurate nanomechanical properties with highest resolution.
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