Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.
作者： S. Van Aert , A.J. den Dekker , A. van den Bos , D. Van Dyck , J.H. Chen
DOI: 10.1016/J.ULTRAMIC.2005.03.002
关键词:
摘要: This paper is the second part of a two-part on maximum likelihood (ML) estimation structure parameters from electron microscopy images. In order to show practical applicability theoretical methods described in first this paper, an experimental study aluminium crystal presented. study, parameters, atom column distances particular, are estimated high-resolution transmission (HRTEM) images using ML method. The necessary steps be made application method will worked out one by one, including model assessment, computation parameter estimates, and construction confidence intervals for these estimates.
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