The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data
作者： S. Van Aert , S. Bals , L. Y. Chang , A. J. den Dekker , A. I. Kirkland
DOI: 10.1007/978-3-540-85156-1_49
关键词:
摘要: In principle, electron microscopy can provide accurate and precise numbers for the unknown structure parameters of materials under study. As an example, atomic column positions be determined with accuracy precision that is orders magnitude better than resolution microscope. This requires, however, a quantitative, model-based method. our opinion, maximum likelihood (ML) method most appropriate one since it has optimal statistical properties. contribution aims to explain basic principles limitations Moreover its practical applicability usefulness will demonstrated using recent experimental examples.
springer.com
sci-hub.st 参考文章(4)
A.J. den Dekker, S. Van Aert, A. van den Bos, D. Van Dyck, Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: a theoretical framework. Ultramicroscopy. ,vol. 104, pp. 83- 106 ,(2005) , 10.1016/J.ULTRAMIC.2005.03.001
Mark Huijben, Guus Rijnders, Dave H. A. Blank, Sara Bals, Sandra Van Aert, Jo Verbeeck, Gustaaf Van Tendeloo, Alexander Brinkman, Hans Hilgenkamp, Electronically coupled complementary interfaces between perovskite band insulators. Nature Materials. ,vol. 5, pp. 556- 560 ,(2006) , 10.1038/NMAT1675
S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck, J.H. Chen, Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example. Ultramicroscopy. ,vol. 104, pp. 107- 125 ,(2005) , 10.1016/J.ULTRAMIC.2005.03.002
Sara Bals, Sandra Van Aert, Gustaaf Van Tendeloo, David Ávila-Brande, Statistical Estimation of Atomic Positions from Exit Wave Reconstruction with a Precision in the Picometer Range Physical Review Letters. ,vol. 96, pp. 096106- ,(2006) , 10.1103/PHYSREVLETT.96.096106