Adsorption and co-adsorption of boron and oxygen on ordered α-SiC surfaces

作者: V.M. Bermudez

DOI: 10.1016/0169-4332(94)00295-9

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摘要: Abstract Boron layers (grown by thermal decomposition of B10H14) on the (0001) Si- and C-terminated surfaces α-SiC have been studied using Auger electron energy-loss spectroscopies low-energy diffraction. Adsorption O2 clean B-adsorbed was also studied. Cleaning surface annealing in a flux Si vapor gives (3 × 3) structure which converts to 3 upon further vacuum. The consists an ordered layer chemisorbed termination layer, while involves arrangement vacancies. A (1 1) is observed for C-face. B Si-face eliminates reconstruction, produces complicated superstructure. Stronger interaction occurs leading incommensurately loosely termed “Si boride” due substantial changes SiL2,3VV KLL lineshapes. On C-face, disordered forms. B-free surfaces, room-temperature chemisorption slower C-face than Si-face, but rates O uptake become comparable with increasing coverage as way oxidation. For rapid, oxidation very slow. all three adsorbed suppresses has little or no effect

参考文章(83)
O. Madelung, H. Landolt, R. Börnstein, W. Martienssen, Landolt-Börnstein numerical data and functional relationships in science and technology, New series Springer. ,(1996)
J.W. Warren, T.M. Besmann, B.M. Gallois, Chemical vapor deposition of refractory metals and ceramics II Pittsburgh, PA (United States); Materials Research Society. ,(1990)
H. Huang, S. Y. Tong, J. Quinn, F. Jona, Atomic structure of Si(111) (√3̄×√3̄)R30°-B by dynamical low-energy electron diffraction Physical Review B. ,vol. 41, pp. 3276- 3279 ,(1990) , 10.1103/PHYSREVB.41.3276
T. M. Grehk, P. Mårtensson, J. M. Nicholls, Occupied and unoccupied surface states on the Si(111)√3 × √3 :B surface Physical Review B. ,vol. 46, pp. 2357- 2362 ,(1992) , 10.1103/PHYSREVB.46.2357
P. J. Chen, M. L. Colaianni, J. T. Yates, The thermal dissociation of decaborane on Si(111)‐(7×7) and doping effects in the near surface region Journal of Applied Physics. ,vol. 72, pp. 3155- 3160 ,(1992) , 10.1063/1.351477
L. D. Marks, R. Ai, S. Savage, J. P. Zhang, Ultrahigh vacuum microscopy of the Si(111) boron √3×√3R30° surface Journal of Vacuum Science and Technology. ,vol. 11, pp. 469- 473 ,(1993) , 10.1116/1.578758
R. Kaplan, Surface structure and composition of β- and 6H-SiC Surface Science. ,vol. 215, pp. 111- 134 ,(1989) , 10.1016/0039-6028(89)90704-8
A. O. Evwaraye, S. R. Smith, M. Skowronski, W. C. Mitchel, Observation of surface defects in 6H-SiC wafers Journal of Applied Physics. ,vol. 74, pp. 5269- 5271 ,(1993) , 10.1063/1.354269
Ignatius S. T. Tsong, Atomic-level characterization of cubic silicon carbide surfaces - A review Journal of the American Ceramic Society. ,vol. 76, pp. 269- 272 ,(1993) , 10.1111/J.1151-2916.1993.TB03778.X
T. P. Chen, T. F. Lei, H. C. Lin, C. Y. Chang, W. Y. Hsieh, L. J. Chen, Low temperature growth of silicon‐boron layer by ultrahigh vacuum chemical vapor deposition Applied Physics Letters. ,vol. 64, pp. 1853- 1855 ,(1994) , 10.1063/1.111777