Analogy between electrical and structural properties of electron-beam-deposited SnO2
作者： M.H. Madhusudhana Reddy , S.R. Jawalekar , A.N. Chandorkar
DOI: 10.1016/0040-6090(90)90121-S
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摘要: The electrical properties of electron-beam-evaporated SnO2 films were studied under various evaporation and annealing conditions. These explained by correlating them with the structural prepared same long-term stability these was then sensor operating conditions to determine deposition for gas applications. From correlation experiments, it established that, because their superior properties, deposited at 25 350 °C more suitable applications than intermediate substrate temperatures.
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