Perturbations in applied electron spectroscopy caused by the vicinity of the surface: Part I. A descriptive model of the substrate line shape

摘要: Abstract From observations reported in the literature it follows that lines related to a given transition and recorded by electron spectroscopy may comprise several components appearing as consequence of differences electronic properties bulk near-surface (or interface) regions. As variation shape resultant line can be expected with alteration experimental conditions. This results distortion some measured features line, including its intensity if defined way commonly used applied spectroscopy. The evaluation distortions gives values too large neglected. Therefore is necessary introduce into currently formulae for an additional factor which allows effects taken account. It possible derive describes these considered based on descriptive model substrate shape.