Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
作者： Noel H. Turner
DOI: 10.1021/AC00163A024
关键词:
摘要: This fundamental review is on the subject of X-ray photoelectron spectroscopy (XPS) and Auger electron (AES) for period 1983-1985. The will cover literature abstracted in Chemical Abstracts between November 16, 1983, 4, 1985. written three separate parts convenience reader: section A, XPS; B, AES; C, combined XPS-AES topics. XPS AES are used widely analysis surfaces. From about 1970 to present time, these techniques have grown acceptance by scientific community. Much this activity has been documented earlier Fundamental Application Reviews Analytical Chemistry. While lengthy, it not an all-inclusive bibliography during period. articles selected with idea improvement state-of-the-art techniques. goal help analysts solve problems that encountered using a regular laboratory commercially available equipment. 382 references.
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