Temperature model for Ge2Sb2Te5 phase change memory in electrical memory device

作者: Daolin Cai , Zhitang Song , Houpeng Chen , Xiaogang Chen

DOI: 10.1016/J.SSE.2010.12.001

关键词:

摘要: Abstract A temperature model of the phase change memory (PCM) cell having Ge 2 Sb Te 5 (GST) layer has been proposed and demonstrated based on a thermal physical electrical characteristics. Calculating radius PCM with different reset voltage pulse voltage–current curves by equation, crystalline fraction can be got. It is found that active region increase increasing. The experimental results are consistent simulation results.

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