An Application of the Linear Errors-in-Variables Model in Semiconductor Device Performance Assessment

作者: Necip Doganaksoy , Hans van Meer

DOI: 10.1080/08982112.2015.1068330

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摘要: Designers and manufacturers in the semiconductor industry constantly seek ways of improving device performance without an undue increase power consumption. A particular concern for battery powered mobile electronics is increased propensity cu..

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