Noise Analysis of Brush Scan Long Wave Infra-Red camera

摘要: The noise of an imaging system is defined as all unexpected output the system. It's one most important factors that restrict performance a Noise testing therefore critical to designing and evaluating. first step separate various components from total noise. For single detector infra-red system, parameter, equivalent temperature difference, NETD, usually used. Ref. [1]NETD however not enough for present-day systems with focus panel arrays, FPAs. signals detect elements in FPAs are read out amplifier serially by shift-register. Thus should include caused nonuniformity among them. [2] D'Agostino Webb use 3-D model analyze FPAs, which separates certain component applying average operators three dimensions. dimension can be found subtracting its value There special difficult while such applied Brush Scan long wave (LWIR) camera composed several smaller arrays because technique reasons. Each part has independent readout circuit amplifier. Data parallely.