作者: Shigeto Takei , Yoshihiro Otagiri , Akimitsu Morisako , Mitsunori Matsumoto
DOI: 10.1063/1.370024
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摘要: SmCo/Cr films were prepared with the thickness of SmCo layer varying from 1 to 400 nm, and dependence magnetic properties on was studied. Atomic force microscopy (AFM) measurement revealed that both Cr underlayer very similar in surface morphology roughness (Ra) about 6 nm for thinner than 100 nm. The contributes generate small grain size smooth as well improve its properties. maximum coercivity 3.3 kOe, squareness coercive plane direction 0.91 0.97, respectively, when 40 diameter switching unit estimated by volume smaller 30 while AFM observations show a 50 or more. microstructure bilayer promise be suitable high density recording media applications.