作者: Michael J. Wodjenski , James V. McManus , Richard S. Ray , Edward E. Jones , Barry Lewis Chambers
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摘要: Apparatus and methods for cleaning ion implanters and/or components thereof are described, utilizing agents reacted with residue deposits to effect removal thereof. An endpoint detection apparatus method also disclosed, which may be integrated in the provide highly efficient utilization of agent avoidance deleterious effects that otherwise can occur when continued exposed an implanter or after has been completed.