Composition determination from HREM images of substitutional alloys

作者: A.F. De Jong , D. Van Dyck

DOI: 10.1016/0304-3991(90)90044-M

关键词:

摘要: Abstract The relation between the contrast in an HREM image of a substitutional alloy and local composition is studied within framework real-space theory electron scattering. Two algorithms are derived to determine composition: deconvolution convolution. tested on simulated images Al x Ga 1− As, GaAs/AlAs interface As with randomly occupied group III sites. method very sensitive small deviations from linear relationship composition, influence neighbouring columns. more robust convolution works best for defocus values optimizing differences GaAs AlAs images, sample thickness around 10 nm. It estimated that under optimal imaging conditions compositions can be determined separate columns atoms accuracy ±0.10.

参考文章(12)
A. Ourmazd, D. W. Taylor, J. Cunningham, C. W. Tu, Chemical mapping of semiconductor interfaces at near atomic resolution. Physical Review Letters. ,vol. 62, pp. 933- 936 ,(1989) , 10.1103/PHYSREVLETT.62.933
N. Tanaka, J. M. Cowley, Electron-microscope imaging of short-range order in disordered alloys Acta Crystallographica Section A. ,vol. 43, pp. 337- 346 ,(1987) , 10.1107/S0108767387099318
A. Ourmazd, W. T. Tsang, J. A. Rentschler, D. W. Taylor, Determination of the atomic configuration at semiconductor interfaces Applied Physics Letters. ,vol. 50, pp. 1417- 1419 ,(1987) , 10.1063/1.97840
W. Coene, D. Van Dyck, J. Van Landuyt, S. Amelinckx, High-resolution structure imaging of partially disordered atomic columns in binary alloy systems Philosophical Magazine Part B. ,vol. 56, pp. 415- 427 ,(1987) , 10.1080/13642818708221328
J. M. Cowley, A. P. Pogany, Diffuse scattering in electron diffraction patterns. I. General theory and computational methods Acta Crystallographica Section A. ,vol. 24, pp. 109- 116 ,(1968) , 10.1107/S0567739468000148
J. C. H. Spence, Albert V. Crewe, Experimental High-Resolution Electron Microscopy ,(1980)
Yoshifumi Suzuki, Hiroshi Okamoto, High Contrast TEM Observation of Lattice Image of GaAs-Al0.28Ga0.72As Superlattice with [100] Electron Beam Incidence Japanese Journal of Applied Physics. ,vol. 24, pp. L696- L698 ,(1985) , 10.1143/JJAP.24.L696
J. M. Howe, D. P. Basile, N. Prabhu, M. K. Hatalis, Minimum detectable solute concentration in atomic‐resolution transmission electron microscopy Acta Crystallographica Section A. ,vol. 44, pp. 449- 461 ,(1988) , 10.1107/S0108767388001400