作者: Yong-Tao Cui , Bo Wen , Eric Y. Ma , Georgi Diankov , Zheng Han
DOI: 10.1103/PHYSREVLETT.117.186601
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摘要: We report simultaneous transport and scanning microwave impedance microscopy to examine the correlation between quantization filling of bulk Landau levels in quantum Hall regime gated graphene devices. Surprisingly, a comparison these measurements reveals that quantized typically occurs below complete levels, when is still conductive. This result points revised understanding carriers are accumulated by gating. discuss implications on study effect related topological states other two-dimensional electron systems.