作者: A. Carmel Mary Esther , Deeksha Porwal , Maurya Sandeep Pradeepkumar , Dinesh Rangappa , Anand Kumar Sharma
DOI: 10.1016/J.PHYSB.2015.09.017
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摘要: Abstract Vanadium pentoxide (V 2 O 5 ) coatings on quartz and Si(111) substrates are grown by pulsed RF magnetron sputtering technique at constant power of 700 W room temperature. Phase, microstructure surface morphology investigated X-ray diffraction, field emission scanning electron microscopy atomic force techniques, respectively. The transmittance reflectance spectra recorded for the solar region (200–2300 nm) spectral window. Further, optical constants viz. band gap, refractive index extinction coefficient deposited V estimated. Thickness dependent gaps found in range 2.78–2.59 eV. Wavelength characteristic is also observed both coefficient. Finally, thickness present coating predicted theoretically which matched well with measured direct measurement e.g., nanoprofilometry technique.