作者: P. Luches , F. Pagliuca , S. Valeri
DOI: 10.1039/C4CP02723J
关键词:
摘要: The modifications of the stoichiometry, morphology and surface structure cerium oxide ultrathin films induced by thermal treatments under vacuum oxygen partial pressure were studied using in situ X-ray photoemission spectroscopy, scanning tunnelling microscopy low energy electron diffraction. effect film nominal thickness, heating temperature time on degree reduction was investigated. is more relevant surface, where different ordered structures observed at degrees for very thin films. obtained results are discussed taking into account dimensionality effects proximity Pt substrate. After it always possible to re-oxidize back their original oxidation state treatment oxygen-rich conditions.