作者: Jia You Feng , Yi Zheng , Fang Wei Zhang , Yu Dian Fan
DOI: 10.1016/0040-6090(95)07084-2
关键词:
摘要: Abstract Lattice-mismatched ZnTe(100) epilayers and highly (111)-oriented ZnTe film were grown on GaAs(100), Si(100), glass substrates, respectively, by ionized cluster beam epitaxy at a growth rate of up to 1.2 nm s −1 . From the analysis X-ray diffraction reflection high-energy electron diffraction, layers shown be epitaxial films. It was found that crystalline quality depended substrate temperature. At low temperature 300 °C, optimum films GaAs, Si exhibit full width half maximum (FWHM) values rocking curves 110, 148 1417 arc sec, respectively.