Applications of Low-Energy Ion Scattering
作者： H. H. Brongersma , L. C. M. Beirens , G. C. J. Ligt
DOI: 10.1007/978-1-4684-0856-0_3
关键词:
摘要: Low-energy (0–10 keV) ion scattering (LEIS, ISS or NIRMS) is used for obtaining information on the atomic composition and structure of surfaces. The extreme sensitivity technique to outermost layer gives it unique properties as compared with other analytical techniques.
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sci-hub.st 参考文章(28)
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