Techniques for temperature-controlled ion implantation

作者: Edwin A. Arevalo , Vikram Singh , Richard Stephen Muka , Jonathan Gerald England , Ziwei Fang

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摘要: Techniques for temperature-controlled ion implantation are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus implantation. The comprise a platen to hold wafer in single-wafer process chamber during implantation, including: clamping mechanism secure onto and provide predetermined thermal contact between platen, or more heating elements pre-heat maintain temperature range above room temperature. also post-cooling station cool down after further handling assembly load pre-heated remove from station.

参考文章(64)
Maria J. Anc, Robert P. Dolan, Low defect density, thin-layer, soi substrates ,(2001)
Francois J. Henley, Michael A. Bryan, William G. En, High temperature implant apparatus ,(2000)
Christopher Berry, William Leavitt, Steven Richards, Beam stop for use in an ion implantation system ,(2003)
John W. Vanderpot, Robert E. Kaim, Donald W. Berrian, Ion beam scanning method and apparatus ,(1987)