3 – x-Ray Diffraction Spectrometry
作者： Y. CAUCHOIS , C. BONNELLE
DOI: 10.1016/B978-0-12-196902-8.50009-7
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sci-hub.st 参考文章(53)
Jesse W. M. DuMond, The spectroscopy of nuclear gamma-rays by direct crystal diffraction methods Ergebnisse der Exakten Naturwissenschaften. ,vol. 28, pp. 232- 301 ,(1954) , 10.1007/BFB0109322
Arne Eld Sandström, Experimental Methods of X-ray Spectroscopy: Ordinary Wavelengths Handbuch der Physik. ,vol. 6, pp. 78- 245 ,(1957) , 10.1007/978-3-642-45863-7_2
R. Bubáková, J. Drahokoupil, A. Fingerland, The single crystal diffraction patterns of silicon Czechoslovak Journal of Physics. ,vol. 12, pp. 764- 775 ,(1962) , 10.1007/BF01691773
M Blackman, Diffraction from a Bent Crystal Proceedings of the Physical Society. Section B. ,vol. 64, pp. 625- 630 ,(1951) , 10.1088/0370-1301/64/8/301
Leon Shenfil, Warren E. Danielson, Jesse W. M. DuMond, A Point Focusing X‐Ray Monochromator for the Study of Low Angle Diffraction Journal of Applied Physics. ,vol. 23, pp. 854- 859 ,(1952) , 10.1063/1.1702319
Jesse W. M. DuMond, A High Resolving Power, Curved‐Crystal Focusing Spectrometer for Short Wave‐Length X‐Rays and Gamma‐Rays Review of Scientific Instruments. ,vol. 18, pp. 626- 638 ,(1947) , 10.1063/1.1741017
Dwight W. Berreman, Jesse W. M. DuMond, Pierre E. Marmier, New Point‐Focusing Monochromator Review of Scientific Instruments. ,vol. 25, pp. 1219- 1220 ,(1954) , 10.1063/1.1770990
Thomas C. Furnas, Point‐Focusing Two‐Crystal X‐Ray Monochromator for X‐Ray Diffraction Review of Scientific Instruments. ,vol. 28, pp. 1042- 1048 ,(1957) , 10.1063/1.1715798
J. Drahokoupil, A. Fingerland, DOUBLE-CRYSTAL SPECTROMETER WITH RELATIVELY HIGH VERTICAL DIVERGENCE AND INSTRUMENTAL DISTORTION OF X-RAY SPECTRA. Czechoslovak Journal of Physics. ,vol. 18, pp. 1190- 1203 ,(1968) , 10.1007/BF01690024
John H. Williams, A Correction to Wave-length Measurements with the Double-Crystal Spectrometer Physical Review. ,vol. 40, pp. 636- 636 ,(1932) , 10.1103/PHYSREV.40.636