Development of advanced electron tomography in materials science based on TEM and STEM
作者： Mao-hua LI , Yan-qing YANG , Bin HUANG , Xian LUO , Wei ZHANG
DOI: 10.1016/S1003-6326(14)63441-5
关键词:
摘要: The recent developments of electron tomography (ET) based on transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the field of materials science were introduced. The various types of ET based on TEM as well as STEM were described in detail, which included bright-field (BF)-TEM tomography, dark-field (DF)-TEM tomography, weak-beam dark-field (WBDF)-TEM tomography, annular dark-field (ADF)-TEM tomography, energy-filtered transmission electron microscopy (EFTEM) tomography …
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