XEDS STEM tomography for 3D chemical characterization of nanoscale particles.
作者： Arda Genc , Libor Kovarik , Meng Gu , Huikai Cheng , Paul Plachinda
DOI: 10.1016/J.ULTRAMIC.2013.03.023
关键词:
摘要: We present a tomography technique which couples scanning transmission electron microscopy (STEM) and X-ray energy dispersive spectrometry (XEDS) to resolve 3D distribution of elements in nanoscale materials. STEM imaging when combined with XEDS mapping using symmetrically arranged detector design around the specimen overcomes many obstacles chemical materials successfully elucidates information large field view (TEM) sample. employed this investigate Nickel (Ni), Manganese (Mn) Oxygen (O) Li1.2Ni0.2Mn0.6O2 (LNMO) nanoparticle used as cathode material Lithium (Li) ion batteries. For purpose, 2D elemental maps were acquired for range tilt angles reconstructed obtain an isolated LNMO nanoparticle. The results highlight strength analysis by resolving Ni, Mn O distributions discovering new phenomenon Ni surface segregation material. Furthermore, comparison simultaneously high angle annular dark (HAADF) shows that provides additional especially there is low atomic number (Z) contrast interest.
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