Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology
作者： P. Schlossmacher , D.O. Klenov , B. Freitag , H.S. von Harrach
DOI: 10.1017/S1551929510000404
关键词: Optoelectronics 、 Silicon drift detector 、 Schottky diode 、 Lens (optics) 、 Energy Dispersive Spectrometer 、 Sensitivity (control systems) 、 Detector 、 Electronics 、 Materials science 、 Analytical chemistry 、 Tilt (optics)
摘要: … Light element detection was demonstrated as well as the capability to detect elements in … The latter indicates that the element detection limit (minimum mass fraction of an element) for …
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