Evaluation of diamond gauge factor up to 500 °C

作者: Akira Yamamoto , Nawachi Norio , Tsutsumoto Takahiro

DOI: 10.1016/J.DIAMOND.2007.02.010

关键词:

摘要: Abstract Gauge factors of boron-doped polycrystalline diamond films were investigated in the ranges from room temperature to 500 °C and 0 0.07 MPa applied pressure. A VCR fitting was used as a package for measurement at high temperature. Undoped deposited on Si substrate by hot filament chemical vapor deposition (CVD) method. chip fabricated with bulk micro machining technique. The gauge evaluated furnace. calculated values found vary range 5–241. decreased increased around 100–300 °C. However, higher up 500 °C, it increased.

参考文章(12)
Akira Yamamoto, Norio Nawachi, Takahiro Tsutsumoto, Akira Terayama, Pressure sensor using p-type polycrystalline diamond piezoresistors Diamond and Related Materials. ,vol. 14, pp. 657- 660 ,(2005) , 10.1016/J.DIAMOND.2004.09.001
W. L. Wang, X. Jiang, K. Taube, C.-P. Klages, Piezoresistivity of polycrystalline p-type diamond films of various doping levels at different temperatures Journal of Applied Physics. ,vol. 82, pp. 729- 732 ,(1997) , 10.1063/1.365606
Masahiro Deguchi, Nobuhiro Hase, Makoto Kitabatake, Hidetoshi Kotera, Susumu Shima, Masatoshi Kitagawa, Piezoresistive property of CVD diamond films Diamond and Related Materials. ,vol. 6, pp. 367- 373 ,(1997) , 10.1016/S0925-9635(96)00727-3
Curtis E. Johnson, Wayne A. Weimer, Daniel C. Harris, Characterization of diamond films by thermogravimetric analysis and infrared spectroscopy Materials Research Bulletin. ,vol. 24, pp. 1127- 1134 ,(1989) , 10.1016/0025-5408(89)90070-6
M. Adamschik, R. Müller, P. Gluche, A. Flöter, W. Limmer, R. Sauer, E. Kohn, Analysis of piezoresistive properties of CVD-diamond films on silicon Diamond and Related Materials. ,vol. 10, pp. 1670- 1675 ,(2001) , 10.1016/S0925-9635(01)00393-4
J.L. Davidson, D.R. Wur, W.P. Kang, D.L. Kinser, D.V. Kerns, Polycrystalline diamond pressure microsensor Diamond and Related Materials. ,vol. 5, pp. 86- 92 ,(1996) , 10.1016/0925-9635(96)80010-0
O. Dorsch, K. Holzner, M. Werner, E. Obermeier, R.E. Harper, C. Johnston, P.R. Chalker, I.M. Buckley-Golder, Piezoresistive effect of boron-doped diamond thin films Diamond and Related Materials. ,vol. 2, pp. 1096- 1099 ,(1993) , 10.1016/0925-9635(93)90279-B
M. Aslam, I. Taher, A. Masood, M. A. Tamor, T. J. Potter, Piezoresistivity in vapor-deposited diamond films Applied Physics Letters. ,vol. 60, pp. 2923- 2925 ,(1992) , 10.1063/1.106821
R. Ramesham, T. Roppel, C. Ellis, B. F. Hajek, Characterization of Synthetic Diamond Thin Films Journal of The Electrochemical Society. ,vol. 137, pp. 3203- 3205 ,(1990) , 10.1149/1.2086186
A. Yamamoto, T. Tsutsumoto, Piezoresistive effect of CVD polycrystalline diamond films Diamond and Related Materials. ,vol. 13, pp. 863- 866 ,(2004) , 10.1016/J.DIAMOND.2003.12.017