Pulsed-Laser Testing for Single-Event Effects Investigations
作者： S. P. Buchner , F. Miller , V. Pouget , D. P. McMorrow
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摘要: The application of pulsed lasers to the study Single-Event Effects (SEEs) in integrated circuits and devices is described. role a laser provide spatial temporal information about SEEs, that not available when broad-beam ion sources are used. A detailed description given mechanisms involved, including light propagation absorption by both linear non-linear processes. Numerous examples highlight versatility usefulness technique SEEs.
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