作者: Ju Hyun Oh , Dorim Kim , Byung Chun Choi , Sung Heum Park , Jung Hyun Jeong
DOI: 10.1016/J.JALLCOM.2018.04.210
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摘要: Abstract We deposited epitaxial and polycrystalline SrLaMgTaO6 (SLMTO) thin films on SrTiO3 (001) MgO substrates, respectively, using pulsed laser deposition, investigated the dependence of structural photoluminescence (PL) properties substrate. The X-ray diffraction patterns were examined to determine growth behaviors SLMTO substrates. Under same deposition conditions, substrate aligned out plane, whereas those exhibited growth. PL spectra revealed that significantly different visible light emissions. Further, photoelectron spectroscopy (XPS) analysis indicated differences in chemical binding states Ta O Mg bonds surfaces film samples; these play an important role emission.