作者: Robert C. Youngquist , Sally Carr , D. E. N. Davies
DOI: 10.1364/OL.12.000158
关键词:
摘要: An optical evaluation technique is described that suitable for determining the positions and magnitudes of reflection sites within miniature assemblies. This method utilizes coherence effects exhibited by a broadband source referred to as coherence-domain reflectometry. Background theory given, experimental results have demonstrated resolution 10 μm with an dynamic range more than 100 dB.