Depth-Resolved Subsurface Defect Detection in Ceramics Using Optical Gating Techniques

作者: M. Bashkansky , M. D. Duncan , M. Kahn , D. Lewis , J. Reintjes

DOI: 10.1007/978-1-4615-5947-4_256

关键词:

摘要: Components made from advanced ceramics materials find widespread use in many industrial and military applications. However, the presence of defects bulk on surface ceramic parts can alter their operation lead to a reduced lifetime or catastrophic failure. These may include various inclusions, inherent powder defects, poorly distributed second phase material, as well voids cracks. They be introduced at each stage manufacturing process. Near-surface are particularly critical applications since stresses this region component greatest during operation. flaws intrinsic material final stages fabrication (e.g. machining, grinding polishing). Additionally, composite appear delamination internal layers. Because potential market for components is so large, considerable effort has been put into developing non-destructive evaluation (NDE) techniques detect process [1–5].

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