A review of a statistical tool set for the yield enhancement of integrated circuits
作者： R.J. Joyce , R.D. Alderman , T.P. Djeu , J.C. Smith
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摘要: The authors describe a system that Harris Semiconductor has developed to aid in the analysis of circuit failures and predictions functional yeilds. This is based on relational database conjunction with application statistical tools. core uses commercially available INGRES software. design reviewed along supporting software hardware tools used create tool box for yield analysis. Given current levels sophistication involved manufacturing semiconductors, flexibility coupled correct analytical provides powerful enhancement resource. >
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