Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms
作者： Se-Young Jang , Seung-Sun Yoo , Hoon-Sung Kwak
关键词:
摘要: Due to the circuit complexity and number of parameters involved, test relationship a Test Program (TP) might not be fully discovered. Traditionally, TP setup are defined based on domain expertise gathered experience an engineer. Such judgment is time consuming could inefficient especially when new products technologies rapidly developed for competing market. If increases, undetected interrelationship among tests in will also increase. In this paper, inferences performed huge complex using different classification algorithms, with primary goal discover potential relationships fast efficient way. The mining output can used as reference basis engineers improve or reprogram machine replace current exhaustive policy.
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