Mechanisms for forming post-passivation interconnect structure

作者: Hsien-Wei Chen , Ying-Ju Chen

DOI:

关键词:

摘要: Embodiments of mechanisms for forming a semiconductor device are provided. The includes contact pad over substrate. also passivation layer the substrate and first portion pad, second is exposed through an opening. further post-passivation interconnect coupled to pad. In addition, bump outside diffusion barrier physically insulating from while electrically connecting layer.

参考文章(34)
Wen-Hsiung Lu, Hsien-Wei Chen, Yi-Wen Wu, Semiconductor device with bump structure on post-passivation interconncet ,(2011)
Mukul Renavikar, Stephen E. Lehman, Daewoong Suh, Solder joint reliability in microelectronic packaging ,(2006)
Mukul P. Renavikar, Ashay A. Dani, Rajen S. Sidhu, Substrate metallization and ball attach metallurgy with a novel dopant element ,(2009)
Ming-Da Cheng, Chen-Hua Yu, Hsiu-Jen Lin, Chih-Wei Lin, Chung-Shi Liu, Mirng-Ji Lii, Wen-Hsiung Lu, Yi-Wen Wu, Forming Wafer-Level Chip Scale Package Structures with Reduced number of Seed Layers ,(2011)
Carl Wijting, Mika P. Rinne, Klaus F. Doppler, Cassio Barboza Ribeiro, Setup of device to device connection ,(2008)
Cheng-Chung Lin, Ming-Che Ho, Ming-Da Cheng, Zheng-Yi Lim, Hui-Jung Tsai, Chung-Shi Liu, Chien Ling Hwang, Doping Minor Elements into Metal Bumps ,(2010)
Sridhar Balakrishnan, Valery M. Dubin, Mark Bohr, Designs and methods for conductive bumps ,(2003)