作者: Yongsoo Ahn , Mincheol Shin
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摘要: We investigate the ballistic performance of monolayer indium selenide (InSe) n-type FETs, benchmarking with WS2, WSe2, and black phosphorus FETs. utilize first-principles-based quantum transport simulations employing density functional theory nonequilibrium Green’s function. The transfer characteristics, subthreshold swing, drain-induced barrier lowering InSe FETs are assessed compared those benchmarks. Our comparison to benchmark transistors reveals that competitive in ON-state performance, but short-channel effects ultrascaled need be suppressed. favorable for high-performance applications rather than low power ones.