Electromagnetic Singularities and Resonances in Near-Field Optical Probes

摘要: Over the last two decades scanning near-field optical microscopy (SNOM) has demonstrated its ability to provide resolution significantly better than diffraction limit (<20 nm). The general principle of SNOM relies on approach a nanometer-sized object in sample be studied. This nano-object (NO) is usually extremity probe. Regardless nature observed signal (inelastic scattering, fluorescence, etc.), detection light achieved far-field regime where NO acts as mediator between and detector. Figure 1 schematic illustration principle.