作者: P.R. Apte , D. Kumar , R. Pinto , M. Sharon , L.C. Gupta
DOI: 10.1109/77.160157
关键词:
摘要: A four-point contact conductance measurement technique has been developed for measuring the of metal-HTSC film interface. distributed RG model predicts a small nonzero (residual) resistance from which is determined. The described along with first results. >