Nanoscale phase separation in epitaxial Cr-Mo and Cr-V alloy thin films studied using atom probe tomography: Comparison of experiments and simulation
作者： A. Devaraj , T. C. Kaspar , S. Ramanan , S. Walvekar , M. E. Bowden
DOI: 10.1063/1.4901465
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摘要: … the alloy thin films studied in this work, especially for the wide spectrum of thin film applications … decomposition or nucleation and growth can influence the final properties of the films. …
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