Adhesion Measurements on Thick-Film Conductors

作者: TT. Hitch

DOI: 10.1520/STP38634S

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摘要: The paper briefly reviews the measurement of adhesion of conductor film materials and describes in particular the requirements of thick-film technology. The test methods used to measure thick-film adhesion strength, which have been previously described by other workers, are treated from a fundamental basis and are discussed with reference to the usefulness and practicability of the test both for research and for more routine purposes.

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