Determination of site specific interatomic forces between an iron coated tip and the NiO(0 0 1) surface by force field spectroscopy
作者： S.M. Langkat , H. Hölscher , A. Schwarz , R. Wiesendanger
DOI: 10.1016/S0039-6028(03)00076-1
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摘要: Abstract Three-dimensional force fields have been measured in ultrahigh vacuum at low temperatures on a well defined NiO(0 0 1) surface by atomic microscopy the dynamic mode of operation. With an atomically sharp iron coated tip, resolution is obtained close to surface, whereby individual curves can unequivocally be assigned specific lattice sites. The total each site separated into long- and short-range contributions. Long-range forces are fitted 1/ z power law. Short-range interactions show good agreement with Morse potential significantly different interaction energies characteristic lengths oxygen nickel sites, respectively. No systematic deviations neighboring sites were found, which could attributed detection exchange between spins tip
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sci-hub.se 参考文章(36)
H Hosoi, K Sueoka, K Hayakawa, K Mukasa, Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM Applied Surface Science. ,vol. 157, pp. 218- 221 ,(2000) , 10.1016/S0169-4332(99)00529-2
W. Allers, S. Langkat, R. Wiesendanger, Dynamic low-temperature scanning force microscopy on nickel oxide (001) Applied Physics A. ,vol. 72, pp. 27- ,(2001) , 10.1007/S003390100731
M. Guggisberg, M. Bammerlin, Ch. Loppacher, O. Pfeiffer, A. Abdurixit, V. Barwich, R. Bennewitz, A. Baratoff, E. Meyer, H.-J. Güntherodt, Separation of interactions by noncontact force microscopy Physical Review B. ,vol. 61, pp. 11151- 11155 ,(2000) , 10.1103/PHYSREVB.61.11151
T Arai, M Tomitori, Bias dependence of Si(111)7×7 images observed by noncontact atomic force microscopy Applied Surface Science. ,vol. 157, pp. 207- 211 ,(2000) , 10.1016/S0169-4332(99)00527-9
F. J. Giessibl, Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy Science. ,vol. 267, pp. 68- 71 ,(1995) , 10.1126/SCIENCE.267.5194.68
L. Olsson, N. Lin, V. Yakimov, R. Erlandsson, A method for in situ characterization of tip shape in ac-mode atomic force microscopy using electrostatic interaction Journal of Applied Physics. ,vol. 84, pp. 4060- 4064 ,(1998) , 10.1063/1.368618
W. Allers, A. Schwarz, U. D. Schwarz, R. Wiesendanger, A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures Review of Scientific Instruments. ,vol. 69, pp. 221- 225 ,(1998) , 10.1063/1.1148499
Kōichi Mukasa, Hideo Hasegawa, Yuichi Tazuke, Kazuhisa Sueoka, Makoto Sasaki, Kazunobu Hayakawa, Exchange Interaction between Magnetic Moments of Ferromagnetic Sample and Tip: Possibility of Atomic-Resolution Images of Exchange Interactions using Exchange Force Microscopy Japanese Journal of Applied Physics. ,vol. 33, pp. 2692- 2695 ,(1994) , 10.1143/JJAP.33.2692
S Ciraci, A Baratoff, Inder P Batra, None, Tip-sample interaction effects in scanning-tunneling and atomic-force microscopy Physical Review B. ,vol. 41, pp. 2763- 2775 ,(1990) , 10.1103/PHYSREVB.41.2763
H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, R. Wiesendanger, Determination of Tip-Sample Interaction Potentials by Dynamic Force Spectroscopy Physical Review Letters. ,vol. 83, pp. 4780- 4783 ,(1999) , 10.1103/PHYSREVLETT.83.4780