作者: B.D. Ngom , T. Mpahane , N. Manyala , O. Nemraoui , U. Buttner
DOI: 10.1016/J.APSUSC.2008.10.122
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摘要: Abstract Novel highly c-oriented tungsten-doped zinc oxide (WZO) thin films with 1 wt% were grown by pulsed laser deposition (PLD) technique on corning 1737F glass substrate. The effects of energy the structural, morphological as well optical transmission properties studied. transparent average transmittance exceeding 87% in wavelength region lying between 400 and 2500 nm. X-ray diffraction analysis (XRD) results indicated that WZO had c-axis preferred orientation wurtzite structure. Film thickness full width at half maximum (FWHM) (0 0 2) peaks found to be dependent fluence. composition determined through Rutherford backscattering spectroscopy (RBS) appeared independent By assuming a direct band gap transition, values 3.36, 3.34 3.31 eV obtained for corresponding fluence 1, 1.7 2.7 J cm−2, respectively. Compared reported undoped ZnO value 3.37 eV, it is conjectured observed low this study may attributable tungsten incorporation increase high transparency makes useful windows while support idea could good candidates optoelectronic applications.