作者: Fangzhun Guo , Hailin Sun , Taichi Okuda , Keisuke Kobayashi , Toyohiko Kinoshita
DOI: 10.1016/J.SUSC.2007.05.055
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摘要: Abstract Direct observation of the antiferro (AF) magnetic domain structures a NiO (0 0 1) surface is found to be possible using spectroscopy photoelectron low-energy electron microscope (SPELEEM) and commercial UV Hg excitation light source without any polarizers. The principle based on linear dichroism (MLD) effect, where different contrasts are produced according relative angle between antiferromagnetic axis linearly polarized light. observed AF strongly affected by both bulk stresses induced during sample cleaving process. Moreover, irreversible when heated over its Neel temperature then cooled. possibility imaging synchrotron radiation or polarizer attractive.