作者: S. K. Singh , R. Singhal , R. Vishnoi , V. V. S. Kumar , P. K. Kulariya
DOI: 10.1007/S12648-016-0950-6
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摘要: In the present study, 100 MeV Ag7+ ion beam-induced structural and optical modifications of nanocrystalline ZnO thin films are investigated. The grown using radio frequency magnetron sputtering irradiated at fluences 3 × 1012, 1 1013 ions/cm2. incident swift heavy ions induced change in crystallinity together with preferential growth crystallite size along c axis (002) orientation. average is found to be increased from 10.8 ± 0.7 20.5 0.3 nm increasing fluence. Atomic force microscopy analysis confirms variation surface roughness by varying fluences. UV–visible spectroscopy shows decrement transmittance film irradiation. micro-Raman spectra investigated observe ion-induced which support lattice defects higher indicates that ZnO-based devices can used piezoelectric transduction mechanism.