作者: He Feng , Cheng Long Chen , Mitch Chou , Guo Hao Ren , Jia Yue Xu
DOI: 10.4028/WWW.SCIENTIFIC.NET/AMR.652-654.628
关键词:
摘要: Thallium-doped cesium iodide CsI(Tl) scintillation film has been manufactured by radio frequency (RF) magnetron sputter method onto the quartz glass substrates. The X-ray diffraction (XRD) pattern of shows preferable growth crystalline in (200) orientation. optical and properties were investigated, including photoluminescence excitation (PLE), (PL), excited luminescence (XEL) spectra decay curve. main emission peak at about 2.28 eV is related to radiative relaxation from strong-off configuration localized excitons around Tl+ ions. Under UV excitation, presents a single exponential with 545 ns.