Direct measurement of potential steps at grain boundaries in the presence of current flow.
作者： J. R. Kirtley , S. Washburn , M. J. Brady
DOI: 10.1103/PHYSREVLETT.60.1546
关键词:
摘要: We have used a new technique to measure simultaneously the surface topography and potential of current-carrying polycrystalline Au/sub 60/Pd/sub 40/ thin films using scanning tunneling microscope. The variations gradients from macroscopically constant value which are associated with scattering grain boundaries in these observed. find that local changes abruptly at between grains.
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