Refractive index, optical bandgap and oscillator parameters of organic films deposited by vacuum evaporation technique

摘要: Abstract In this work, the organic thin films of 8-hydroxyquinoline aluminum (Alq 3 ), 9,10-bis-( β -naphthyl)-anthrene (ADN), and (III) bis-(2-methyl-8-quninolinato)-4-phenylphenolate (BAlq) were deposited by vacuum evaporation technique, optical dielectric properties investigated. The constants such as refractive index, extinction coefficient, constant dissipation factor determined from measured transmittance spectra using envelope method. Meanwhile, dispersion behavior index was studied in terms single-oscillator Wemple–DiDomenico (W–D) model, physical parameters average oscillator strength, wavelength, energy, parameter energy achieved. Furthermore, bandgap values calculated W–D model Tauc respectively, obtained are agreement with those model. These results provide some useful references for potential application optoelectronic devices.