Correlative t-EBSD Tomography and Atom Probe Tomography Analysis

作者: Y. Chen , K.P. Rice , T.J. Prosa , M.M. Nowell , S.I. Wright

DOI: 10.1017/S1431927616004268

关键词:

摘要:

参考文章(2)
K. Babinsky, W. Knabl, A. Lorich, R. De Kloe, H. Clemens, S. Primig, Grain boundary study of technically pure molybdenum by combining APT and TKD. Ultramicroscopy. ,vol. 159, pp. 445- 451 ,(2015) , 10.1016/J.ULTRAMIC.2015.05.014
K.P. RICE, R.R. KELLER, M.P. STOYKOVICH, Specimen-thickness effects on transmission Kikuchi patterns in the scanning electron microscope. Journal of Microscopy. ,vol. 254, pp. 129- 136 ,(2014) , 10.1111/JMI.12124