作者: K. Babinsky , W. Knabl , A. Lorich , R. De Kloe , H. Clemens
DOI: 10.1016/J.ULTRAMIC.2015.05.014
关键词: Condensed matter physics 、 Atomic resolution 、 Diffraction 、 Atom probe 、 Grain size 、 Molybdenum 、 Grain boundary 、 Analytical chemistry 、 Impurity 、 Focused ion beam
摘要: Abstract Molybdenum is an eligible material for high performance applications. However, its applicability limited because of a brittle-to-ductile transition around room temperature, depending on the grain size and content interstitial impurities present at boundaries. The total amount in current quality molybdenum has become very small last decades. Therefore, atom probe with atomic resolution only suitable site-specific analysis technique. Nevertheless, specimen preparation by focused ion beam (FIB) required to study boundary chemistry effectively. With novel method, which combines re-sharpening pre-electro-polished tips FIB transmission Kikuchi diffraction (TKD), can easily be positioned first 200 nm sample. Furthermore, technique TKD gives opportunity get crystallographic information mapped area and, therefore, character support interpretation data files. In study, APT specimens technically pure contain boundaries were prepared subsequently measured probe. difference segregation unequal types as-deformed recrystallized state discussed.