Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope.
DOI: 10.1016/J.ULTRAMIC.2012.06.004
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摘要: Abstract In this study, the new technique of transmission Kikuchi diffraction (TKD) in scanning electron microscope (SEM) has been applied for first time to enable orientation mapping bulk, nanostructured metals. The results show how improved spatial resolution SEM-TKD, compared conventional EBSD, enables reliable truly metals and alloys, with mean grain sizes 40–200 nm range. is significantly below 10 nm, contrasting examples are shown from both dense (Ni) lighter (Al-alloy) materials. Despite burden preparing thin, electron-transparent samples, using SEM-TKD likely become invaluable routine characterisation nanocrystalline and, potentially, highly deformed microstructures.
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