Method and system for testing P2 stiffness of a magnetoresistance transducer at the wafer level
作者： Changhe Shang
DOI:
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摘要: A method of testing P 2 stiffness a magnetoresistance (MR) sensor stack including pinned layer is provided. The comprises the step applying an external magnetic field to MR stack. oriented substantially perpendicular layer. further varying amplitude field, measuring change in resistance response and calculating based on measured resistance.
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