Two Alignment Methods for the Polarizer and Analyzer in an Ellipsometer
作者： H. G. Liljenvall , A. G. Mathewson
DOI: 10.1364/AO.9.001489
关键词:
摘要:
osapublishing.org
harvard.edu参考文章(1)
Frank L. McCrackin, Elio Passaglia, Robert R. Stromberg, Harold L. Steinberg, Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry Journal of Research of the National Bureau of Standards Section A: Physics and Chemistry. ,vol. 67A, pp. 363- 377 ,(1963) , 10.6028/JRES.067A.040